About This Course
This course provides an overview of Built-In Self-Test (BIST) feature, architecture, and applications. It also provides an overview of Structural-Based Functional Test (SBFT) feature, architecture, and applications. In Part 3, it gives an idea on SRAM/Cashe Testing and kitchen sink algorithm.
Learning Objectives
Successful students will be able to:
- Understand BIST & SBFT application.
- State the purposes of implementing BIST & SBFT
- Understand how BIST complements other test techniques
- Identify the key structures involved in implementing BIST & SBFT
- Identify the structures targeted by BIST & SBFT
- Understand what are Memory Cell, Cache Mapping, Memory Addressing, Cache buffers and
- Different type of memory backgrounds
- Able to read and understand memory testing notation and apply in test
- Understand the physic for a memory cell failure and instability
- Know various type of algorithmic tests and background
- Understand that the test requirements -- different type of algorithmic tests and background data combination are effective for different type of fail mode
Prerequisites
• A Product or Test Engineer with more than 2 year's experience or relevant exposure
OR
• Completed Basic course
• Have basic knowledge of system architecture, CPU micro-architecture and device testing
• Have at basic knowledge about Static Random Access Memory (SRAM).
Target Audience
A Product or Test Engineer with more than a year's experience or relevant exposure (e.g debug engineer, failure analysis engineer, production engineer, etc.)
Training Outline
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BIST Testing
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SBFT Testing
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SRAM/Cache Testing and Kitchen Sink Algorithm