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BIST, SBFT and SRAM Cache Testing with Kitchen Sink Algorithm

About This Course

This course provides an overview of Built-In Self-Test (BIST) feature, architecture, and applications. It also provides an overview of Structural-Based Functional Test (SBFT) feature, architecture, and applications. In Part 3, it gives an idea on SRAM/Cashe Testing and kitchen sink algorithm.

Learning Objectives

Successful students will be able to:

  • Understand BIST & SBFT application.
  • State the purposes of implementing BIST & SBFT
  • Understand how BIST complements other test techniques
  • Identify the key structures involved in implementing BIST & SBFT
  • Identify the structures targeted by BIST & SBFT
  • Understand what are Memory Cell, Cache Mapping, Memory Addressing, Cache buffers and
  • Different type of memory backgrounds
  •  Able to read and understand memory testing notation and apply in test
  • Understand the physic for a memory cell failure and instability
  • Know various type of algorithmic tests and background
  • Understand that the test requirements -- different type of algorithmic tests and background data combination are effective for different type of fail mode


• A Product or Test Engineer with more than 2 year's experience or relevant exposure


• Completed Basic course

• Have basic knowledge of system architecture, CPU micro-architecture and device testing

• Have at basic knowledge about Static Random Access Memory (SRAM).

Target Audience

A Product or Test Engineer with more than a year's experience or relevant exposure (e.g debug engineer, failure analysis engineer, production engineer, etc.)

Training Outline

  1. BIST Testing

  2. SBFT Testing

  3. SRAM/Cache Testing and Kitchen Sink Algorithm